Surface modification of ethylene-co-tetrafluoroethylene films by remote plasmas

Journal of Polymer Science, Part B: Polymer Physics

Volumn 40, Issue 24, 2002, Pages 2871-2882

  Inagaki, Norihiro ^a   Narushima, Kazuo ^a   Lim, Sang Kyoo ^a   Park, Yong Woo ^a   Ikeda, Yousuke ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

AFM; Contact angle; Defluorination; Ethylene co tetrafluoroethylene; FT IR; Plasma modification; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; CONTACT ANGLE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMAS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

DEFLUORINATION; ETHYLENE-CO-TETRAFLUOROETHYLENE; PLASMA MODIFICATION; WEIGHT LOSS RATE;

ORGANIC POLYMERS;

EID: 0037115416     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/polb.10336     Document Type: Article

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