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Volumn 66, Issue 19, 2002, Pages 1933101-1933103
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Ellipsometric characterization of random and random-dimer GaAs-AlxGa1-xAs superlattices
a a b b c |
Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
ARSENIC;
DIMER;
GALLIUM;
ARTICLE;
CALCULATION;
COMPARATIVE STUDY;
CORRELATION ANALYSIS;
CRYSTAL STRUCTURE;
ELLIPSOMETRY;
OPTICS;
STRUCTURE ANALYSIS;
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EID: 0037113584
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (16)
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