Simple X-ray dark- and bright-field imaging using achromatic Laue optics

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 9 A/B, 2002, Pages

  Ando, Masami ^a,c   Maksimenko, Anton ^b   Sugiyama, Hiroshi ^b   Pattanasiriwisawa, Wanwisa ^a   Hyodo, Kazuyuki ^b   Uyama, Chikao ^a  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^c HIROSHIMA INTERNATIONAL UNIVERSITY   (Japan)

Author keywords

Analyzer; Asymmetric monochromator; Refraction contrast; Silicon; Synchrotron radiation; X ray bright field imaging; X ray dark field imaging

Indexed keywords

ABSORPTION; LIGHT REFRACTION; MONOCHROMATORS; PHOTONS; REFRACTIVE INDEX; SYNCHROTRON RADIATION; X RAY OPTICS;

ACHROMATIC LAUE OPTICS;

IMAGING TECHNIQUES;

EID: 0037107049     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l1016     Document Type: Article

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