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Volumn 117, Issue 7, 2002, Pages 3196-3207
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High-resolution spectroscopy of the v3 band of WF6 and ReF6 in a supersonic jet
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
EIGENVALUES AND EIGENFUNCTIONS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
GROUND STATE;
HAMILTONIANS;
MATHEMATICAL OPERATORS;
MATRIX ALGEBRA;
RHENIUM COMPOUNDS;
SEMICONDUCTOR LASERS;
TEMPERATURE;
VAPOR PRESSURE;
DIODE LASER SPECTROMETER;
FULL WIDTH AT HALF MAXIMUM;
LEAST SQUARES FIT;
RHENIUM HEXAFLUORIDE;
SUPERSONIC JET EXPANSION SPECTROSCOPY;
TUNGSTEN HEXAFLUORIDE;
TUNGSTEN COMPOUNDS;
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EID: 0037103733
PISSN: 00219606
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1475754 Document Type: Article |
Times cited : (15)
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References (74)
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