Structural stability and electrical properties of Sr 2FeMoO 6 under high pressure

Journal of Applied Physics

Volumn 92, Issue 4, 2002, Pages 1942-1944

  Zhao, P ^a   Yu, R C ^a   Li, F Y ^a   Liu, Z X ^a   Jin, M Z ^b   Jin, C Q ^a  

^a INSTITUTE OF PHYSICS   (China)

^b JILIN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BIRCH-MURNAGHAN EQUATION; ELECTRICAL RESISTANCES; ENERGY DISPERSIVE X-RAY DIFFRACTIONS; EQUATION OF STATE; FIRST-ORDER DERIVATIVE; HIGH PRESSURE; METALLIC TRANSITION; ROOM TEMPERATURE; STRUCTURAL STABILITIES;

CAPACITANCE MEASUREMENT; ELECTRONIC STRUCTURE; STABILITY; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 0037103559     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1496119     Document Type: Article

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