Near-field optical probing using a microaperture GaInAs/GaAs surface emitting laser

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 41, Issue 6 B, 2002, Pages

  Hashizume, Jiro ^a   Shinada, Satoshi ^a   Koyama, Fumio ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Microaperture; Near field; Optical head; Optical storage; Read out; VCSEL; Vertical surface emitting laser

Indexed keywords

ETCHING; ION BEAMS; LASERS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA STORAGE; OPTICAL RECORDING; REFLECTION; REFRACTIVE INDEX;

DISTRIBUTED BRAGG REFLECTOR; FOCUS ION BEAM ETCHING; NEAR FIELD; OPTICAL PROBING; SPATIAL RESOLUTION; VERTICAL CAVITY SURFACE EMITTING LASER;

SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

EID: 0037098580     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.l700     Document Type: Letter

References (8)