메뉴 건너뛰기




Volumn 21, Issue 12, 2002, Pages 967-969

High-quality epitaxial TiO2 thin films grown on α-Al2O3 substrates by pulsed laser deposition

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; PERMITTIVITY; PULSED LASER DEPOSITION; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0037098249     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1016090110315     Document Type: Article
Times cited : (10)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.