Practical formulations of the electron capture rate in quantum wells by phonon emission at low carrier density

Journal of Applied Physics

Volumn 91, Issue 12, 2002, Pages 9848-9855

  Vallone, Marco ^a  

^a Agilent Technologies/TTC   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL EXPRESSIONS; CAPTURE RATE; CAPTURE TIME; CLOSED FORM; ELECTRON CAPTURE; FINITE TEMPERATURES; LOW CARRIER DENSITY; MOMENTUM DISTRIBUTIONS; PHONON EMISSIONS; PLASMON MODES; POLE APPROXIMATION; STATIC LIMITS;

PHONONS; PLASMONS; SEMICONDUCTOR DEVICE STRUCTURES; TWO DIMENSIONAL;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0037097888     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1477615     Document Type: Article

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