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Volumn 37, Issue 12, 2002, Pages 2597-2606

Crystallization, microstructure development and dielectric behaviour of glass ceramics in the system [SrO · TiO2]-[2SiO2 · B2O3]-La2O3

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; DIELECTRIC MATERIALS; DIELECTRIC RELAXATION; DIFFERENTIAL THERMAL ANALYSIS; HEAT TREATMENT; INTERFACES (MATERIALS); MELTING; PERMITTIVITY; X RAY DIFFRACTION ANALYSIS;

EID: 0037096803     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1015476631462     Document Type: Article
Times cited : (33)

References (18)
  • 15
    • 0005971806 scopus 로고
    • Ph.D. Thesis, The Pennsylvania State University, USA
    • (1985)
    • Swartz, S.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.