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Volumn 37, Issue 12, 2002, Pages 2597-2606
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Crystallization, microstructure development and dielectric behaviour of glass ceramics in the system [SrO · TiO2]-[2SiO2 · B2O3]-La2O3
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL MICROSTRUCTURE;
CRYSTALLIZATION;
DIELECTRIC MATERIALS;
DIELECTRIC RELAXATION;
DIFFERENTIAL THERMAL ANALYSIS;
HEAT TREATMENT;
INTERFACES (MATERIALS);
MELTING;
PERMITTIVITY;
X RAY DIFFRACTION ANALYSIS;
RELAXATION POLARIZATIONS;
GLASS CERAMICS;
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EID: 0037096803
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1015476631462 Document Type: Article |
Times cited : (33)
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References (18)
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