Calibration of magnetic force microscopy using micron size straight current wires

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 8849-8851

  Liu, Congxiao ^a   Lin, Kingston ^a   Holmes, Rich ^a   Mankey, Gary J ^b   Fujiwara, Hideo ^b   Jiang, Huaming ^b   Seok Cho, Hae ^c  

^a WESTERN DIGITAL CORPORATION   (United States)

^b University of Alabama   (United States)

^c SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT AMPLITUDE; FABRICATION PROCESS; LINEAR RELATIONSHIPS; MAGNETIC FORCE MICROSCOPY TIPS; MICRON SIZE; MICRON-SIZE WIRES;

MAGNETIC FORCE MICROSCOPY; MAGNETIC MOMENTS; PHASE SHIFT; PHASE SHIFTERS; PHOTOLITHOGRAPHY;

WIRE;

EID: 0037095215     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1456058     Document Type: Article

References (11)

1. T. Goddenhenrich, H. Lemke, M. Muck, U. Hartmann, and C. Heiden, Appl. Phys. Lett. 57, 2612 (1990). apl APPLAB 0003-6951
2. D. Rugar, H. J. Mamin, P. Guethner, S. Lambert, J. E. Stern, I. McFadyen, and T. Yogi, J. Appl. Phys. 68, 1169 (1990). jap JAPIAU 0021-8979
3. R. B. Proksch, S. Foss, and E. D. Dahlberg, IEEE Trans. Magn. 30, 4467 (1994). emg IEMGAQ 0018-9464
4. K. Babcock, V. Elings, M. Dugas, and S. Loper, IEEE Trans. Magn. 30, 4503 (1994). emg IEMGAQ 0018-9464
5. R. B. Proksch, T. E. Schaffer, B. M. Moskowitz, E. D. Dahlberg, D. A. Bazylinski, and R. B. Frankel, Appl. Phys. Lett. 66, 2582 (1995). apl APPLAB 0003-6951
6. L. Kong and S. Y. Chou, Appl. Phys. Lett. 70, 2042 (1997). apl APPLAB 0003-6951
7. L. Kong and S. Y. Chou, J. Appl. Phys. 81, 5026 (1997). jap JAPIAU 0021-8979
8. Digital Instruments, Santa Barbara, CA.
9. P. Grutter, H. J. Mamin, and D. Rugar, in Scanning Tunneling Microscopy II, edited by R. Weisendanger and H.-J. Guntherodt (Springer, Berlin, 1992), pp. 151-207.
10. K. Babcock, M. Dugas, S. Manalis, and V. Elings, in Evolution of Thin Film and Surface Structure and Morphology, Materials Research Society Symposium Proceedings (MRS, Pittsburgh, 1995), Vol. 355, p. 311. mrs MRSPDH 0272-9172
11. D. Sarid, in Scanner Force Microscopy, edited by M. Lapp and H. Stark (Oxford University Press, New York, 1991), p. 21.