Quantitative analysis of transition curvature by magnetic force microscopy

Journal of Applied Physics

Volumn 91, Issue 10, 2002, Pages 6842-6844

  Liu, Feng ^a   Li, Shaoping ^a   Liu, Yan ^a   Gray, George ^a   Schultz, Allan ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMETER LEVEL; PHASE DEVIATIONS; RECORDING MEDIA; TRANSITION CURVATURE;

PHYSICAL PROPERTIES; PHYSICS;

MAGNETIC FORCE MICROSCOPY;

EID: 0037095140     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1452665     Document Type: Article

References (6)

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