In situ observation of magnetic domain pattern evolution in applied fields by spin-polarized low energy electron microscopy

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 6932-6934

  Poppa, H ^a   Tober, E D ^b   Schmid, A K ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b NUANCE COMMUNICATIONS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACQUISITION TIME; APPLIED FIELD; APPLIED MAGNETIC FIELDS; DOMAIN STRUCTURE; EXPERIMENTAL APPROACHES; HIGH SPATIAL RESOLUTION; IN-SITU; IN-SITU OBSERVATIONS; LOW ENERGY ELECTRON MICROSCOPES; MAGNETIC DOMAIN PATTERNS; MAGNETIC MICROSTRUCTURES; METAL FILM; SPIN-POLARIZED; SPIN-POLARIZED LOW ENERGY ELECTRON MICROSCOPIES; ULTRA-THIN;

ELECTRON MICROSCOPY; MAGNETIC FIELDS;

MAGNETIC DOMAINS;

EID: 0037095059     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1449435     Document Type: Article

References (21)

1. K. L. Man, W. L. Ling, Silena Y. Paik, H. Poppa, M. S. Altman, and Z. Q. Qiu, Phys. Rev. (in press).
2. R. Allenspach, J. Magn. Magn. Mater. 129, 160 (1994). jmm JMMMDC 0304-8853
3. E. Bauer, Rep. Prog. Phys. 57, 895 (1994). rpp RPPHAG 0034-4885
4. E. Bauer, in Handbook of Microscopy, Methods II, edited by S. Amelinckx, D. van Dyck, J. van Landuyt, and G. van Tendeloo (VCH, Weinheim, 1997), p. 751.
5. S. S. P. Parkin, IBM J. Res. Dev. 42, 3 (1998). ibm IBMJAE 0018-8646
6. R. Allenspach and W. Weber, IBM J. Res. Dev. 42, 3 (1998); ibm IBMJAE 0018-8646
7. C. H. Tsang, R. E. Fontana, T. Lin, D. E. Heim, B. A. Gurney, and P. L. Williams, 42, 103 (1998). ibm IBMJAE 0018-8646
8. Y. Acreman et al., Science 290, 492 (2000). sci SCIEAS 0036-8075
9. A. Vaterlaus et al., Phys. Rev. Lett. 84, 2247 (2000). prl PRLTAO 0031-9007
10. R. Allenspach, IBM J. Res. Dev. 44, 4 (2000). ibm IBMJAE 0018-8646
11. K. Grzelakowski and E. Bauer, Rev. Sci. Instrum. 67, 742 (1996). rsi RSINAK 0034-6748
12. M. S. Altman, H. Pinkvos, J. Hurst, G. Marx, H. Poppa, and E. Bauer, Mater. Res. Soc. Symp. Proc. 232, 125 (1991). mrs MRSPDH 0272-9172
13. J. Chapman, J. Phys. D 17, 623 (1984). jpd JPAPBE 0022-3727
14. R. Proksch, Curr. Opin. Solid State Mater. Sci. 4, 231 (1999). csx COSSFX 1359-0286
15. M. Bode et al., J. Phys.: Condens. Matter 11, 9387 (1999). jcz JCOMEL 0953-8984
16. W. Wulfhekel et al., Appl. Phys. A: Solids Surf. 72, 463 (2001). apa APSFDB 0721-7250
17. O. Pietzsch, A. Kubetzka, M. Bode, and R. Wiesendanger, Science 292, 2053 (2001). sci SCIEAS 0036-8075
18. E. D. Tober, G. Witte, and H. Poppa, J. Vac. Sci. Technol. A 18, 1845 (2000). jva JVTAD6 0734-2101
19. ELMITEC, Inc., Clausthal/Germany.
20. K. L. Man, M. S. ALtman, and H. Poppa, Surf. Sci. 480, 163 (2001). sus SUSCAS 0039-6028
21. California Fine Wire Company, Grover Beach, California.