Effect of Pd addition on the magnetic characteristics of amorphous CoNbZr films

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 8456-8458

  Min, B K ^a   Song, J S ^a   Kim, H S ^a   Jeong, S J ^a  

^a Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS STRUCTURES; ANISOTROPY FIELD; DEPOSITION PROCESS; EXTERNAL MAGNETIC FIELD; LANDAU-LIFSHITZ; MAGNETIC CHARACTERISTIC; OPERATION FREQUENCY; SI WAFER; SOFT MAGNETIC CHARACTERISTICS; SOFT MAGNETIC PROPERTIES;

AMORPHOUS SILICON; ANISOTROPY; COERCIVE FORCE; MAGNETIC FIELDS; PHASE STABILITY; SILICON WAFERS;

AMORPHOUS FILMS;

EID: 0037094931     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1449455     Document Type: Article

References (9)

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