Magnetic anisotropy and magnetoresistance of sputtered [(FeTaN)/(TaN)] n multilayers

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 7532-7534

  Nie, H B ^a   Xu, S Y ^a   Li, J ^a   Ong, C K ^a   Wang, J P ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EASY AXIS; GRAIN SIZE; IN-PLANE ANISOTROPY; IN-PLANE MAGNETIC ANISOTROPY; INTERLAYER COUPLING; MR RATIO; RADIO FREQUENCIES; SI SUBSTRATES; THICKNESS DEPENDENCE; UNIAXIAL ANISOTROPY;

ELECTRIC RESISTANCE; GRAIN SIZE AND SHAPE; MAGNETIC ANISOTROPY; MAGNETOELECTRONICS; MAGNETORESISTANCE; MULTILAYERS;

TANTALUM COMPOUNDS;

EID: 0037094898     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1447875     Document Type: Article

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