High moment FeRhN/NiFe laminated thin films for write head applications

Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 6821-6823

  Jiang, Hai ^a   Chen, Yingjian ^a   Chen, Lifan ^a   Huai, Yiming ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLUMNAR GRAIN STRUCTURE; DC MAGNETRON SPUTTERING; HIGH MOMENT; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; SINGLE LAYER; SOFT MAGNETIC PROPERTIES; SPUTTERING CONDITIONS; UNDERLAYERS; UNIAXIAL ANISOTROPY; WRITE HEADS; X-RAY DIFFRACTION STUDIES;

LAMINATING; THIN FILMS; X RAY DIFFRACTION;

EXCHANGE COUPLING;

EID: 0037094798     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1452658     Document Type: Article

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