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Volumn 91, Issue 10 I, 2002, Pages 8073-8075
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Co/Pd multilayer media with Pd inorganic granular seed layer for perpendicular recording
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AR PLASMAS;
ATOMIC FORCE MICROSCOPE (AFM);
CO/PD MULTILAYERS;
MEAN ROUGHNESS;
NUCLEATION FIELD;
PERPENDICULAR RECORDING;
PERPENDICULAR RECORDING MEDIA;
RF-SPUTTERING;
ROOM TEMPERATURE;
SEED LAYER;
SLOPE PARAMETER;
SOFT MAGNETIC UNDERLAYERS;
SPIN STAND;
SURFACE CONDITIONS;
TRANSMISSION ELECTRON MICROSCOPE;
ATOMIC FORCE MICROSCOPY;
DC POWER TRANSMISSION;
GIANT MAGNETORESISTANCE;
MAGNETIC PROPERTIES;
PLASMA ETCHING;
SILICON NITRIDE;
TRANSMISSION ELECTRON MICROSCOPY;
MULTILAYERS;
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EID: 0037094529
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1447183 Document Type: Article |
Times cited : (20)
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References (8)
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