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Journal of Materials Science Letters

Volumn 21, Issue 6, 2002, Pages 469-472

Positron annihilation studies of electrodeposited copper layers

(2) Dryzek, E a Dryzek, J a

a INSTITUTE OF NUCLEAR PHYSICS (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CURRENT DENSITY; ELECTRODEPOSITION; GRAIN SIZE AND SHAPE; MAGNETRON SPUTTERING; MICROSCOPIC EXAMINATION; PLASTIC DEFORMATION; POSITRON ANNIHILATION SPECTROSCOPY; PRESSURE EFFECTS; TEMPERATURE CONTROL; THICKNESS MEASUREMENT;

COPPER LAYERS; LIFETIME SPECTRA; MICROSCOPIC DEFECTS; OPEN VOLUME DEFECTS; VACANCY CLUSTERS;

COPPER;

EID: 0037088473 PISSN: 02618028 EISSN: None Source Type: Journal
DOI: 10.1023/A:1015330522646 Document Type: Article

Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.