Characterization of self-similar dislocation structures by X-ray diffraction

Materials Science and Engineering: A

Volumn 324, Issue 1-2, 2002, Pages 179-182

  Szekely F ^a   Groma, I ^a   Lendvai, J ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

Dislocation patterning; Fractal dimension; Work hardening

Indexed keywords

COPPER; DISLOCATIONS (CRYSTALS); PLASTIC DEFORMATION; X RAY DIFFRACTION ANALYSIS;

FLUCTUATIONS;

SINGLE CRYSTALS;

FRACTAL ANALYSIS;

EID: 0037083784     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01308-9     Document Type: Article

References (18)