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Volumn 72, Issue 4, 2002, Pages 341-347

The resonance escape factor for Voigt and Lorentz line profiles in atomic absorption measurements

Author keywords

Atomic absorption spectroscopy; Escape factor; Line profile; Plasma

Indexed keywords

DISPERSION (WAVES); GROUND STATE; RADIATION; SPECTROSCOPY; THERMAL EFFECTS;

EID: 0037082731     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(01)00128-5     Document Type: Article
Times cited : (27)

References (12)
  • 2
    • 0006069528 scopus 로고
    • Interpretation of line broadening and line shift
    • Lochte Holtgreven W editor. Amsterdam: North-Holland, [chapter 2]
    • (1968) Plasma Diagnostics
    • Traving, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.