Small angle X-ray scattering and electrical resistivity measurements on an Al-2Li-5Mg-0.1Zr alloy

Materials Chemistry and Physics

Volumn 73, Issue 2-3, 2002, Pages 268-273

  Truong, C T ^a   Kabisch, O ^b   Gille, W ^b   Schmidt, U ^b  

^a INSTITUTE OF MATERIALS SCIENCE   (Viet Nam)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Activation energy; Ageing process; Al Li alloy; Electrical resistivity; Ostwald ripening; Small angle X ray scattering

Indexed keywords

ACTIVATION ENERGY; ELECTRIC CONDUCTIVITY MEASUREMENT; GROWTH (MATERIALS); X RAY SCATTERING;

OSTWALD RIPENING;

ALUMINUM ALLOYS;

EID: 0037081522     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(01)00388-1     Document Type: Article

References (19)