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Optics Communications

Volumn 201, Issue 4-6, 2002, Pages 363-372

m-lines technique application for studying of optical nonlinearities in thin films at a low light intensity

(1) Khomchenko, Alexander V a

a Institute of Applied Optics NAS B (Belarus)

Author keywords

Fourier spectrum; Interface; m lines; Optical nonlinearity; Thin film

Indexed keywords

MULTILAYERS; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; THIN FILMS;

FOURIER SPECTROSCOPY; OPTICAL BAND GAPS;

NONLINEAR OPTICS;

EID: 0037081305 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(01)01683-2 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.