Atomic and electronic structure determination for a series of Al-Re-Si MI-type 1/1-cubic approximants

Journal of Alloys and Compounds

Volumn 342, Issue 1-2, 2002, Pages 397-401

  Onogi, Tomohide ^a   Takeuchi, Tsunehiro ^a   Mizutani, Uichiro ^a   Sato, Hirokazu ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b AICHI UNIVERSITY OF EDUCATION   (Japan)

Author keywords

Electron transport properties; Quasicrystal; Rietveld analysis; Weak localization

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; ELECTRON TRANSPORT PROPERTIES; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; FERMI LEVEL; QUASICRYSTALS; SPECTRUM ANALYSIS; SYNCHROTRON RADIATION; THERMAL EFFECTS;

RIETVELD ANALYSIS;

ALUMINUM COMPOUNDS;

EID: 0037077586     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(02)00263-3     Document Type: Article

References (19)

1. The LMTO method