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Volumn 43, Issue 22, 2002, Pages 6005-6012
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In situ study of nanostructure and morphological development during the crystal-mesophase transition of poly (di-n-hexylsilane) and poly (di-n-butylsilane) by x-ray and hot-stage AFM
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Author keywords
Crystal mesophase transition; Morphology; Polysilane
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Indexed keywords
ANISOTROPY;
ATOMIC FORCE MICROSCOPY;
CONFORMATIONS;
ELECTRONIC DENSITY OF STATES;
MORPHOLOGY;
X RAY DIFFRACTION;
CRYSTAL-MESOPAHSE TRANSITION;
POLYMERS;
POLY(DI N BUTYLSILANE);
POLY(DI N HEXYLSILANE);
SILANE DERIVATIVE;
UNCLASSIFIED DRUG;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
CRYSTAL STRUCTURE;
DENSITY;
MOLECULAR DYNAMICS;
MORPHOLOGY;
PHASE TRANSITION;
RADIATION SCATTERING;
TEMPERATURE SENSITIVITY;
X RAY DIFFRACTION;
POLYMER;
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EID: 0037072928
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(02)00398-1 Document Type: Article |
Times cited : (2)
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References (19)
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