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Volumn 67, Issue 2, 2002, Pages 275-284
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Investigation on the influence of thickness and temperature on the Seebeck coefficient of silver telluride thin films
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Author keywords
Hysteresis; Phase transition; Seebeck coefficient; Silver telluride; Thin films
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Indexed keywords
ANNEALING;
ELECTRIC POTENTIAL;
ELECTRON SCATTERING;
HYSTERESIS;
PHASE TRANSITIONS;
SEEBECK EFFECT;
SILVER COMPOUNDS;
SEEBACK COEFFICIENT;
THIN FILMS;
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EID: 0037072585
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0042-207X(02)00274-9 Document Type: Article |
Times cited : (15)
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References (29)
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