Microstructural analysis of AU/NI multilayers interfaces by SAXS and STM

Applied Surface Science

Volumn 188, Issue 1-2, 2002, Pages 182-187

  Labat, S ^a   Guichet, C ^a   Thomas, O ^a   Gilles, B ^b   Marty, A ^b  

^a AIX MARSEILLE UNIVERSITY   (France)

^b CEA GRENOBLE   (France)

Author keywords

Multilayers; Numerical simulations; Roughness; STM; X ray scattering

Indexed keywords

COMPUTER SIMULATION; GOLD; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; INTERFACES (MATERIALS); METALLOGRAPHIC MICROSTRUCTURE; SCANNING TUNNELING MICROSCOPY; STATISTICAL METHODS; SURFACE ROUGHNESS; X RAY SCATTERING;

MULTILAYERS INTERFACES;

MULTILAYERS;

EID: 0037070658     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00739-5     Document Type: Article

References (4)