Charged-particle spectroscopy in the microsecond range following projectile fragmentation

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 493, Issue 3, 2002, Pages 155-164

  Pfutzner M ^a   Badura, E ^b   Grzywacz, R ^a   Janas, Z ^a   Momayezi, M ^c   Bingham, C ^d   Blank, B ^e   Chartier, M ^f   Geissel, H ^b   Giovinazzo, J ^e   Hellstrom M ^b   Kurcewicz, J ^a   Lalleman, A S ^e   Mazzocchi, C ^b   Mukha, I ^b   Plettner, C ^b   Roeckl, E ^b   Rykaczewski, K P ^a,g   Schmidt, K ^h   Simon, R S ^b   Stanoiu, M ⁱ   Thomas, J C ^e   more..

^a UNIVERSITY OF WARSAW   (Poland)

^b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^c XIA   (United States)

^d UNIVERSITY OF TENNESSEE   (United States)

^e CENTRE D ETUDES NUCLÉAIRES DE BORDEAUX GRADIGNAN   (France)

^f UNIVERSITY OF LIVERPOOL   (United Kingdom)

^g OAK RIDGE NATIONAL LABORATORY   (United States)

^h UNIVERSITY OF EDINBURGH   (United Kingdom)

ⁱ GANIL   (France)

Author keywords

2p radioactivity; Charged particle spectroscopy; Projectile fragmentation

Indexed keywords

AMPLIFIERS (ELECTRONIC); CHARGED PARTICLES; HEAVY IONS; ION IMPLANTATION; RADIOACTIVITY; SPECTROSCOPIC ANALYSIS;

PROJECTILE FRAGMENTATION;

NUCLEAR INSTRUMENTATION;

EID: 0037064540     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01567-X     Document Type: Article

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