A study of the precision factors of large-scale object surface profile laser scanning measurement

Journal of Materials Processing Technology

Volumn 129, Issue 1-3, 2002, Pages 584-587

  Wang, L S ^a   Lee, D L ^b   Nie, M Y ^c   Zheng, Z W ^a  

^a JILIN UNIVERSITY   (China)

^b SHANGHAI MARINE EQUIPMENT RESEARCH INSTITUTE   (China)

^c 176 RenMin Street Changchun City Jilin Province 130022   (China)

Author keywords

3D measurement; Large scale object; Laser scanning; Precision factors

Indexed keywords

GAUSSIAN NOISE (ELECTRONIC); IMAGE PROCESSING; LASER APPLICATIONS; OPTICAL FILTERS; PROBLEM SOLVING; SCANNING; SPECKLE; TRIANGULATION;

IMAGE DISTORTIONS; LASER SCANNING; LASER TRIANGULATION SYSTEMS;

SURFACE MEASUREMENT;

EID: 0037063806     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(02)00650-7     Document Type: Conference Paper

References (10)

1. Meadows D.M., Johnson W.O., Allen J.B. Appl. Opt. 9 4 1970 942-947.
2. Takeda M., Mutoh K. Appl. Opt. 22 24 1983 3977-3982.
3. Srinivasan V., Liu H.C., Halioua M. Appl. Opt. 23 18 1984 3105-3108.
4. Riorx M. Appl. Opt. 23 21 1984 3837-3844.
5. Fan K.C., Wen K.P. SPIE 2101 1993 949-958.
6. R.C. Bolles, M.A. Fischler, Proceedings of the Seventh International Joint Conference on Artificial Intelligence, 1981, pp. 637-643.
7. W.F. Clocksin, P.G. Darey, C.G. Morgan, A.R. Vikler, IFS Publications, Bedford, UK, 1983, pp. 187-198.
8. M. Oslima, Y. Shirai, Proceedings of the Seventh International Joint Conference on Artificial Intelligence, 1981, pp. 601-606 Datta, S.K. Parui, Pattern Recog. 80 (8) (1992) 1263-1285.
9. M. Oslima, Y. Shirai, Proceedings of the Seventh International Joint Conference on Artificial Intelligence, 1981, pp. 601-606 Datta, S.K. Parui, Pattern Recog. 80 (8) (1992) 1263-1285.
10. S. Dravida, J.W. Woods, W.C. Shen, Proceedings of the 1984 IEEE ICASSP Conference, vol. 2, 1984.