Single-exposure simultaneous diffraction-enhanced imaging

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 492, Issue 1-2, 2002, Pages 236-240

  Hasnah, M ^a   Oltulu, O ^a   Zhong, Z ^b   Chapman, D ^a  

^a ILLINOIS INSTITUTE OF TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE DIFFRACTION; IMAGE ANALYSIS; LIGHT ABSORPTION; LIGHT REFRACTION; LIGHT SOURCES; SYNCHROTRONS;

CRYSTAL ANALYZERS; DIFFRACTION-ENHANCED IMAGING (DEI);

IMAGING TECHNIQUES;

EID: 0037063798     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(02)01288-3     Document Type: Article

References (4)

1. Zhong Z.et al. Nucl. Instr. and Meth. A. 450:2000;556.
2. Chapman D.et al. Phys. Med. Biol. 42:1997;2015.
3. R.W. James, The Optical Principles of the Diffraction of X-rays, Ox Bow Press, Woodbridge, CT, 1982, p. 54 (Chapter 2).
4. Zachariasen W.H. Theory of X-ray Diffraction in Crystals. 1945;Wiley, New York. (Chapter 4).