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Volumn 483, Issue 3, 2002, Pages 603-610

Application of a secondary-electron transmission monitor for high-precision intensity measurements of relativistic heavy-ion beams

Author keywords

Calibration methods; Measurement of heavy ion beam intensity; Secondary electron transmisson monitor

Indexed keywords

CALIBRATION; ELECTRIC CURRENTS; ELECTRONS; HEAVY IONS; ION BEAMS; TITANIUM;

EID: 0037062079     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01931-3     Document Type: Article
Times cited : (37)

References (12)
  • 9
    • 0006071106 scopus 로고    scopus 로고
  • 10
    • 0006102366 scopus 로고
    • Diploma Thesis, Institut für Kernphysik, TH Darmstadt
    • (1992)
    • Ziegler, C.1
  • 11
    • 0006028469 scopus 로고
    • Ph.D. Thesis, Institut für Kernphysik, TH Darmstadt
    • (1994)
    • Brohm, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.