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Volumn 38, Issue 8, 2002, Pages 373-374

Fast electromagnetic characterisation method of thin planar materials using coplanar line up to V-band

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DIELECTRIC FILMS; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE TRANSMISSION; NUMERICAL METHODS; PERMITTIVITY; SCATTERING PARAMETERS; SILICON; SUBSTRATES;

EID: 0037061759     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20020272     Document Type: Article
Times cited : (7)

References (8)
  • 5
    • 0015980602 scopus 로고    scopus 로고
    • Automatic measurement of complex dielectric constant and permeability at microwave frequencies
    • Proc. IEEE, 1974 , vol.62 , Issue.1 , pp. 33-36
    • Weir, W.B.1
  • 6
    • 0003420193 scopus 로고
    • Contribution à l'élaboration d'une nouvelle méthode de caractérisation électromagnétique de matériaux à partir de lignes plaquées - Applications à l'étude de nouveaux matériaux
    • Thèse d'Université en Electronique, Lille, France, May
    • (1995)
    • Hinojosa, J.1
  • 8
    • 17344387634 scopus 로고
    • Accuracy predictions for new generation network analyzer
    • (1984) Microwave J. , vol.6 , pp. 127-141
    • Doneker, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.