|
Volumn 38, Issue 8, 2002, Pages 373-374
|
Fast electromagnetic characterisation method of thin planar materials using coplanar line up to V-band
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINA;
DIELECTRIC FILMS;
ELECTRIC NETWORK ANALYZERS;
ELECTROMAGNETIC WAVE PROPAGATION;
ELECTROMAGNETIC WAVE REFLECTION;
ELECTROMAGNETIC WAVE TRANSMISSION;
NUMERICAL METHODS;
PERMITTIVITY;
SCATTERING PARAMETERS;
SILICON;
SUBSTRATES;
DIELECTRIC SUBSTRATE;
ELECTROMAGNETIC CHARACTERISATION METHOD;
PERMITTIVITY EXTRACTION METHOD;
THIN PLANAR MATERIAL;
VECTOR NETWORK ANALYSER;
ELECTROMAGNETIC WAVE POLARIZATION;
|
EID: 0037061759
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:20020272 Document Type: Article |
Times cited : (7)
|
References (8)
|