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Volumn 72, Issue 3, 2002, Pages 235-241
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Interface characterisation of ZnSe/CuGaSe2 heterojunction
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CHARGE CARRIERS;
COPPER COMPOUNDS;
CRYSTALS;
ENERGY GAP;
EVAPORATION;
FERMI LEVEL;
HOLE MOBILITY;
INTERFACES (MATERIALS);
SEMICONDUCTING ZINC COMPOUNDS;
FLASH EVAPORATION;
HETEROJUNCTIONS;
FABRICATION;
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EID: 0037061232
PISSN: 0038092X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-092X(02)00004-X Document Type: Article |
Times cited : (4)
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References (12)
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