Characteristics of Dy/W( 1 1 2 ) thin films during epitaxial growth

Surface Science

Volumn 521, Issue 1-2, 2002, Pages

  Moslemzadeh, N ^a   Barrett, S D ^a   Ledieu, J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Growth; Lanthanides; Low energy electron diffraction (LEED); Metallic films; Scanning tunneling microscopy; Tungsten

Indexed keywords

DYSPROSIUM; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

ATOMIC ROWS;

THIN FILMS;

EID: 0037058788     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02317-8     Document Type: Article

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