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Volumn 41, Issue 29, 2002, Pages 6055-6061
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Axial imaging necessitates loss of lateral shift invariance
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Author keywords
[No Author keywords available]
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Indexed keywords
BINOCULARS;
INTERFEROMETERS;
OPTICAL MICROSCOPY;
OPTICAL RESOLVING POWER;
PATTERN RECOGNITION;
PHOTODETECTORS;
AXIAL IMAGING;
SHIFT INVARIANCE;
IMAGING SYSTEMS;
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EID: 0037057803
PISSN: 1559128X
EISSN: 21553165
Source Type: Journal
DOI: 10.1364/AO.41.006055 Document Type: Article |
Times cited : (5)
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References (7)
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