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Volumn 146, Issue 1-3, 2002, Pages 169-175

In situ measurement of particle deposition and its removal in microfiltration by ultrasonic time-domain reflectometry

Author keywords

In situ visualization; Membrane cleaning; Membrane fouling; Microfiltration; Particle deposition; Ultrasonic time domain reflectometry

Indexed keywords

MICROFILTRATION; REFLECTOMETERS; SCANNING ELECTRON MICROSCOPY; VISUALIZATION;

EID: 0037056611     PISSN: 00119164     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-9164(02)00521-0     Document Type: Article
Times cited : (48)

References (10)
  • 9
    • 84992594800 scopus 로고    scopus 로고
    • MSc. Thesis, University of Stellenbosch, South Africa
    • (2000)
    • Koen, L.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.