Erratum: Atomic force microscopy study of the CaF2(1 1 1) surface. From cleavage via island to evaporation topographies (Surface Science (2000) 448 (187) PII: S0039602899011942)

Surface Science

Volumn 516, Issue 1-2, 2002, Pages 216-217

  Engelhardt, J B ^a   Dabringhaus, H ^a   Wandelt, K ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

Atomic force microscopy; Clusters; Evaporation and sublimation

Indexed keywords

EID: 0037056212     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02028-9     Document Type: Erratum

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