메뉴 건너뛰기
Surface Science
Volumn 514, Issue 1-3, 2002, Pages 19-26
Effect of interfaces on quantum confinement in Ge dots grown on Si surfaces with a SiO2 coverage
(2)
Shklyaev, Alexander A
a
Ichikawa, Masakazu
b
a
JT RES CENTER FOR ATOM TECHNOLOGY
(
Japan
)
b
UNIVERSITY OF TOKYO
(
Japan
)
Author keywords
Germanium; Growth; Nucleation; Photoluminescence; Quantum effects; Semiconductor semiconductor heterostructures; Silicon
Indexed keywords
GERMANIUM; HETEROJUNCTIONS; NUCLEATION; PHOTOLUMINESCENCE; PHOTONS; SEMICONDUCTOR QUANTUM DOTS; SURFACE PHENOMENA; ULTRATHIN FILMS;
QUANTUM EFFECTS;
SILICA;
EID
:
0037055562
PISSN
:
00396028
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0039-6028(02)01602-3
Document Type
:
Conference Paper
Times cited : (
62
)
References (
34
)
1
0035128280
(2001)
Phys. Rev. B
, vol.63
, pp. 045312-045321
Yakimov, A.I.
1
Stepina, N.P.
2
Dvurechenskii, A.V.
3
Nikiforov, A.I.
4
Nenashev, A.V.
5
2
0342588018
(2000)
Phys. E
, vol.7
, pp. 146
Miesner, C.
1
Rothig, O.
2
Brunner, K.
3
Abstreiter, G.
4
3
0034226429
(2000)
Thin Solid Films
, vol.369
, pp. 33
Eberl, K.
1
Schmidt, O.G.
2
Duschl, R.
3
Kienzle, O.
4
Ernst, E.
5
Rau, Y.
6
4
0000007913
(1998)
Phys. Rev. B
, vol.57
, pp. 8805
Peng, C.S.
1
Huang, Q.
2
Cheng, W.Q.
3
Zhou, J.M.
4
Zhang, Y.H.
5
Sheng, T.T.
6
Tung, C.H.
7
5
3643143147
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 1020
Mo, Y.-W.
1
Savage, D.E.
2
Swatzentruber, B.S.
3
Lagally, M.G.
4
6
0000514183
(1998)
Phys. Rev. B
, vol.58
, pp. 15647
Shklyaev, A.A.
1
Shibata, M.
2
Ichikawa, M.
3
7
2642521291
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 2340
Schmidt, O.G.
1
Lange, C.
2
Eberl, K.
3
Kienzle, O.
4
Ernst, F.
5
8
0032313255
(1998)
Thin Solid Films
, vol.336
, pp. 69
Butz, R.
1
Lüth, H.
2
9
0034226608
(2000)
Thin Solid Films
, vol.369
, pp. 96
Kim, J.Y.
1
Ihm, S.H.
2
Seok, J.H.
3
Lee, C.H.
4
Lee, Y.H.
5
Suh, E.-K.
6
Lee, H.J.
7
10
0001039972
(2000)
Phys. Rev. B
, vol.62
, pp. 1540
Shklyaev, A.A.
1
Shibata, M.
2
Ichikawa, M.
3
11
0001760259
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 3541
Barski, A.
1
Derivaz, M.
2
Rouvière, J.L.
3
Buttard, D.
4
12
0035938304
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 2563
Kolobov, A.V.
1
Shklyaev, A.A.
2
Oyanagi, H.
3
Fons, P.
4
Yamasaki, S.
5
Ichikawa, M.
6
13
0000140187
(1997)
Rev. Sci. Instrum.
, vol.68
, pp. 116
Maruno, S.
1
Nakahara, H.
2
Fujita, S.
3
Watanabe, H.
4
Kusumi, Y.
5
Ichikawa, M.
6
14
0000057059
(1996)
Rev. Sci. Instrum.
, vol.67
, pp. 4185
Watanabe, H.
1
Ichikawa, M.
2
15
0001126512
(1994)
Phys. Rev. B
, vol.50
, pp. 5012
Chambliss, D.D.
1
Johnson, K.E.
2
16
0033148931
(1999)
Thin Solid Films
, vol.346
, pp. 1
Zinke-Allmang, M.
1
17
0009770989
(1995)
Surf. Sci.
, vol.329
, pp. 167
Kobayashi, Y.
1
Prabhakaran, K.
2
Ogino, T.
3
18
0029309042
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 3024
Sunamura, H.
1
Usami, N.
2
Shiraki, Y.
3
Fukatsu, S.
4
19
0001520373
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2982
Palange, E.
1
Capellini, G.
2
Di Gaspare, L.
3
Evangelisti, F.
4
20
0001174136
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 2509
Schmidt, O.G.
1
Denker, U.
2
Eberl, K.
3
Kienzle, O.
4
Ernst, F.
5
21
0034497761
(2000)
Thin Solid Films
, vol.380
, pp. 78
Yam, V.
1
Thanh, V.L.
2
Compagnon, U.
3
Gennser, U.
4
Boucaud, P.
5
Débarre, D.
6
Bouchier, D.
7
22
0034503596
(2000)
Thin Solid Films
, vol.380
, pp. 180
Miesner, C.
1
Brunner, K.
2
Abstreiter, G.
3
23
0035911396
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 1658
Dunbar, A.
1
Halsall, M.
2
Dawson, P.
3
Bangert, U.
4
Miura, M.
5
Shiraki, Y.
6
24
0034226926
(2000)
Thin Solid Films
, vol.369
, pp. 79
Markov, V.A.
1
Cheng, H.H.
2
Chia, C.-T.
3
Nikiforov, A.I.
4
Cherepanov, V.A.
5
Pchelyakov, O.P.
6
Zhuravlev, K.S.
7
Talochkin, A.B.
8
McGlynn, E.
9
Henry, M.O.
10
25
0000291038
(1989)
Phys. Rev. B
, vol.39
, pp. 1235
Schwartz, G.P.
1
Hybertsen, M.S.
2
Bevk, J.
3
Nuzzo, R.G.
4
Mannaerts, J.P.
5
Gualtieri, G.J.
6
26
0003877566
Springer, Berlin
(1996)
Fundamentals of Semiconductors
Yu, P.Y.
1
Cardona, M.
2
27
0003308296
Electronic structure and optical properties of semiconductors
Springer-Verlag, Berlin
(1989)
Springer Series Solid-State Science, second ed.
, vol.75
Cohen, M.L.
1
Chelikowsky, J.R.
2
28
21544445254
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 2511
Min, K.S.
1
Shcheglov, K.V.
2
Yang, C.M.
3
Atwater, H.A.
4
Brongersma, M.L.
5
Polman, A.
6
29
0000796126
(1998)
Phys. Rev. B
, vol.58
, pp. 7921
Takeoka, S.
1
Fujii, M.
2
Hayashi, S.
3
Yamamoto, K.
4
30
0009771657
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 1219
Nishikawa, H.
1
Stathis, J.H.
2
Cartier, E.
3
31
0009768835
(2000)
Nature
, vol.408
, pp. 404
Pavesi, L.
1
Dal Negro, L.
2
Mazzoleni, C.
3
Franzo, G.
4
Priolo, F.
5
32
21544434700
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 2684
Zhang, D.
1
Kolbas, R.M.
2
Milewski, P.D.
3
Lichtenwalner, D.J.
4
Kingon, A.I.
5
Zavada, J.M.
6
33
0001644050
(1997)
Phys. Rev. B
, vol.56
Kanemitsu, Y.
1
Okamoto, S.
2
34
0001423194
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 2962
Zhuravlev, K.S.
1
Gilinsky, A.M.
2
Kobitsky, A.Y.
3
* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.
