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Volumn 406, Issue 1-2, 2002, Pages 164-173

Characterization of annealed pulsed laser deposited (PLD) thin films of cesium oxythiomolybdate (Cs2MoOS3)

Author keywords

Cesium oxythiomolybdate (Cs2MoOS3); Tribology; X Ray diffraction (XRD); X Ray photoelectron spectroscopy (XPS)

Indexed keywords

ANNEALING; CESIUM COMPOUNDS; CRYSTAL STRUCTURE; INORGANIC COATINGS; OXIDATION; PULSED LASER DEPOSITION; SOLID LUBRICANTS; SUBSTRATES; TRIBOLOGY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0037051252     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01743-6     Document Type: Article
Times cited : (6)

References (24)
  • 18
    • 0008838853 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Dayton, Dayton, OH, USA
    • (2000)
    • Strong, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.