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Volumn 406, Issue 1-2, 2002, Pages 164-173
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Characterization of annealed pulsed laser deposited (PLD) thin films of cesium oxythiomolybdate (Cs2MoOS3)
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Author keywords
Cesium oxythiomolybdate (Cs2MoOS3); Tribology; X Ray diffraction (XRD); X Ray photoelectron spectroscopy (XPS)
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Indexed keywords
ANNEALING;
CESIUM COMPOUNDS;
CRYSTAL STRUCTURE;
INORGANIC COATINGS;
OXIDATION;
PULSED LASER DEPOSITION;
SOLID LUBRICANTS;
SUBSTRATES;
TRIBOLOGY;
X RAY DIFFRACTION ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CONTINUOUS POWDER FEEDING;
THIN FILMS;
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EID: 0037051252
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01743-6 Document Type: Article |
Times cited : (6)
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References (24)
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