Light-induced absorption changes in In-doped congruent LiNbO3

Applied Physics Letters

Volumn 81, Issue 24, 2002, Pages 4505-4507

  Sunarno, Steven ^a   Tomita, Yasuo ^a   Zhang, Guoquan ^a,b  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^b NANKAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DOPING (ADDITIVES); INDIUM; LIGHT ABSORPTION; MELTING;

INTRINSIC DEFECTS;

LITHIUM COMPOUNDS;

EID: 0037049592     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1526165     Document Type: Article

References (16)

1. O.F. Schirmer, O. Thiemann, and M. Wöhlecke, J. Phys. Chem. Solids 52, 185 (1991).
2. G. Zhong, J. Jian, and Z. Wu, in Proceedings of the 11th International Quantum Electronics Conference (IEEE, New York, 1980), p. 631.
3. T.R. Volk, V.I. Pryalkin, and N.M. Rubinina, Opt. Lett. 15, 996 (1990).
4. T.R. Volk and N.M. Rubinina, Ferroelectr. Lett. 14, 37 (1992).
5. T.Volk, M. Wöhlecke, N. Rubinina, N.V. Razumovski, F. Jermann, C. Fischer, and R. Böwer, Appl. Phys. A: Mater. Sci. Process. 60, 217 (1995).
6. Y. Kong, J. Wen, and H. Wang, Appl. Phys. Lett. 66, 280 (1995).
7. T. Volk, M. Wöhlecke, N. Rubinina, A. Reichert, and N. Razumovski, Ferroelectrics 183, 291 (1996).
8. D. Xue, K. Betzler, and H. Hesse, J. Appl. Phys. 89, 849 (2001).
9. G. Zhang, Y. Tomita, W. Xu, and C. Yang, Appl. Phys. Lett. 77, 3508 (2000).
10. G. Zhang, S. Sunarno, M. Hoshi, Y. Tomita, C. Yang, and W. Xu, Appl. Opt. 40, 5248 (2001).
11. K. Kasemir, K. Betzler, B. Matzas, B. Tiegel, T. Wahlbrink, M. Wöhlecke, B. Gather, N. Rubinina, and T. Volk, J. Appl. Phys. 84, 5191 (1998).
12. J. Koppitz, O.F. Schirmer, M. Wöhlecke, A. Kusnetsov, and B.C. Grabmaier, Ferroelectrics 92, 233 (1989).
13. F. Jermann, M. Simon, R. Böwer, E. Krätzig, and O.F. Schirmer, Ferroelectrics 165, 319 (1995).
14. Y. Tomita, M. Hoshi, and S. Sunarno, Jpn. J. Appl. Phys., Part 2 40, L1035 (2001).
15. H. Guenther, R. Macfarlane, Y. Furukawa, K. Kitamura, and R. Neurgaonkar, Appl. Opt. 37, 7611 (1998).
16. B. Faust, H. Müller, and O.F. Schirmer, Ferroelectrics 153, 297 (1994).