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Volumn 125-126, Issue , 2002, Pages 302-308

Sensitivity and stability evaluation of the deep drawing process

Author keywords

Deep drawing; FEM analysis; Optimisation; Sensitivity; Stability

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; OPTIMIZATION; PARAMETER ESTIMATION; PRODUCTION ENGINEERING; SENSITIVITY ANALYSIS;

EID: 0037047816     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(02)00334-5     Document Type: Conference Paper
Times cited : (25)

References (6)
  • 5
    • 85069028051 scopus 로고    scopus 로고
    • VDI-Richtlinien VDI 3200, Bl.2 Düsseldorf, 1982


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.