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Volumn 88, Issue 14, 2002, Pages

Charge localization in collision-induced multiple ionization of van der Waals clusters with highly charged ions

(5) Tappe, W a Flesch, R a Ruhl E a Hoekstra, R a Schlatholter T a

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ELECTRON CYCLOTRON RESONANCE; ELECTRON ENERGY LEVELS; ION SOURCES; MASS SPECTROMETRY; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; MONTE CARLO METHODS; PHOTOIONIZATION; POSITIVE IONS; VAN DER WAALS FORCES; XENON;

CHARGE LOCALIZATION; COLLISION-INDUCED MULTIPLE IONIZATION; COULOMB EXPLOSION; COULOMB REPULSION; FRAGMENTATION DYNAMICS; HIGHLY CHARGED ION; ION-INDUCED FRAGMENTATION; KINETIC ENERGY RELEASE; MULTICOINCIDENCE TIME OF FLIGHT METHOD;

ATOMIC PHYSICS;

EID: 0037041102 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (34)

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