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Acta Materialia

Volumn 50, Issue 1, 2002, Pages 101-108

Direct observation of basal dislocation in sapphire by HRTEM

(3) Nakamura, Atsutomo a Yamamoto, Takahisa a Ikuhara, Yuichi a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

Dislocations; High temperature; High resolution transmission electron microscopy (HRTEM); Sapphire ( Al2O3)

Indexed keywords

COMPACTION; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); DISSOCIATION; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH TEMPERATURE OPERATIONS; TRANSMISSION ELECTRON MICROSCOPY;

HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);

SAPPHIRE;

EID: 0037039179 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6454(01)00318-4 Document Type: Article

Times cited : (48)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.