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Volumn 344, Issue 1-2, 2002, Pages 170-174
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Interaction between rare earth silicate glasses (RE = Y, La, Nd, Dy) and silicon carbide substrates
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Author keywords
Powder metallurgy; Scanning electron microscopy; Surfaces and interfaces; X ray diffraction
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Indexed keywords
ENERGY DISPERSIVE SPECTROSCOPY;
GLASS;
INTERFACES (MATERIALS);
SCANNING ELECTRON MICROSCOPY;
SILICATES;
SILICON CARBIDE;
SURFACE REACTIONS;
X RAY DIFFRACTION ANALYSIS;
RARE EARTH SILICATE GLASSES;
RARE EARTH COMPOUNDS;
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EID: 0037037588
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-8388(02)00334-1 Document Type: Conference Paper |
Times cited : (3)
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References (10)
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