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Volumn 47, Issue 7, 2002, Pages 1205-1217

Measurement of backscattered x-ray spectra at the water surface in the energy range 60 kV to 120 kV

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DETECTORS; ELECTRIC POTENTIAL; SILICON; TUNGSTEN; X RAY SPECTROMETERS;

EID: 0037035359     PISSN: 00319155     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-9155/47/7/314     Document Type: Article
Times cited : (6)

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  • 11
    • 0025140589 scopus 로고
    • Dependence of the photon backscatter factor for water on source-to-phantom distance and irradiation field size
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  • 15
    • 2142798878 scopus 로고
    • Tables of x-ray mass attenuation coefficients and mass energy-absorption coefficients 1 keV to 20 MeV for elements Z = 1 to 92 and 48 additional substances of dosimetric interest National Institute of Standards and NISTIR 5632 (Gaithersburg, MD: National Institute of Standards and Technology)
    • (1995)
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    • (1987) Technical Report , pp. 58
  • 17
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    • Experimentally determined backscatter factors for x-rays generated at voltages between 16 and 140 kV
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    • Klevenhagen, S.C.1
  • 18
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    • Development of a diagnostic x-ray spectrometer with a lithium-drifted silicon detector for intercomparison and image analysis
    • (1971) Radiology , vol.101 , pp. 401-410
    • Lerch, I.A.1    Haus, A.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.