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Volumn 47, Issue 7, 2002, Pages 1205-1217
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Measurement of backscattered x-ray spectra at the water surface in the energy range 60 kV to 120 kV
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKSCATTERING;
DETECTORS;
ELECTRIC POTENTIAL;
SILICON;
TUNGSTEN;
X RAY SPECTROMETERS;
WATER SURFACE;
MEDICINE;
SILICON;
TUNGSTEN;
WATER;
AIR;
ARTICLE;
COMPTON EFFECT;
CONTROLLED STUDY;
DIODE;
MEASUREMENT;
PRIORITY JOURNAL;
RADIATION DETECTOR;
RADIATION ENERGY;
RADIATION SCATTERING;
X RAY;
X RAY SPECTROMETRY;
ALUMINUM;
MONTE CARLO METHOD;
PHANTOMS, IMAGING;
PHOTONS;
RADIOMETRY;
RADIOTHERAPY DOSAGE;
SCATTERING, RADIATION;
WATER;
X-RAYS;
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EID: 0037035359
PISSN: 00319155
EISSN: None
Source Type: Journal
DOI: 10.1088/0031-9155/47/7/314 Document Type: Article |
Times cited : (6)
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References (24)
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