Laser ablation and time-of-flight mass-spectrometric study of SiO

Applied Surface Science

Volumn 193, Issue 1-4, 2002, Pages 149-155

  Torres, Ricardo ^a   Martin, Margarita ^a  

^a INSTITUTO DE QUÍMICA FÍSICA ROCASOLANO   (Spain)

Author keywords

Laser ablation; Si n cluster formation; SiO; Time of flight mass spectroscopy

Indexed keywords

IONS; LASER ABLATION; MASS SPECTROMETRY; SILICON COMPOUNDS; THERMAL PLUMES;

LASER WAVELENGTHS; TIME-OF-FLIGHT MASS SPECTROSCOPY (TOF-MS);

SURFACE REACTIONS;

EID: 0037024497     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00255-6     Document Type: Article

References (23)