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Volumn 47, Issue 15, 2002, Pages 2473-2482
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The influence of a mixed radiation environment on the properties of the passive film on tungsten
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Author keywords
Electrochemical impedance spectroscopy; High energy protons; Mott Schottky; Radiation; Surface enhanced Raman spectroscopy; Tungsten
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Indexed keywords
ADSORPTION;
DIFFUSION;
ELECTRONIC PROPERTIES;
METALLIC FILMS;
POINT DEFECTS;
PROTON IRRADIATION;
RAMAN SPECTROSCOPY;
TRANSPORT PROPERTIES;
TUNGSTEN;
MOTT-SCHOTTKY (MS) METHOD;
PASSIVE FILMS;
ELECTROCHEMISTRY;
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EID: 0037024444
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(02)00107-X Document Type: Article |
Times cited : (16)
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References (39)
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