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Volumn 193, Issue 1-4, 2002, Pages 1-10
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XRD, SEM, AFM, HRTEM, EDAX and RBS studies of chemically deposited Sb 2 S 3 and Sb 2 Se 3 thin films
a
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Author keywords
Characterizations; Nanocrystalline thin films; Sb 2 S 3 and Sb 2 Se 3
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
DEPOSITION;
ENERGY DISPERSIVE SPECTROSCOPY;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
OPTIMIZATION;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING ANTIMONY COMPOUNDS;
STOICHIOMETRY;
SURFACE PROPERTIES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
CHALCOGENIDE FILMS;
THIN FILMS;
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EID: 0037024043
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00819-4 Document Type: Article |
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Times cited : (72)
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References (27)
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