Structural characterization of monolayer and regularly stacked multi-layers composed of silver nanoparticles by using X-ray reflectivity

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 197, Issue 1-3, 2002, Pages 1-5

  Kuwajima, Shuichiro ^a   Okada, Yuji ^a   Yoshida, Yuji ^a   Abe, Koji ^a   Tanigaki, Nobutaka ^a   Yamaguchi, Tomohiko ^a   Nagasawa, Hiroshi ^b   Sakurai, Kenji ^c   Yase, Kiyoshi ^a  

^a NATL INST OF MAT AND CHEM RES   (Japan)

^b Osaka Prefecture University   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Closed pack; Layer structure; Monolayer; Multilayer; Nanoparticle; X ray reflectivity

Indexed keywords

CHARACTERIZATION; MULTILAYERS; NANOSTRUCTURED MATERIALS; PACKING; REFLECTION; SILVER; X RAY ANALYSIS;

QUASI-BRAGG REFLECTION (QBR);

MONOLAYERS;

NANOPARTICLE; SILVER;

ARTICLE; CALCULATION; CHEMICAL STRUCTURE; DENSITY; PRIORITY JOURNAL; STRUCTURE ANALYSIS; THICKNESS; X RAY ANALYSIS;

EID: 0037016799     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(01)00580-5     Document Type: Article

References (12)