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Volumn 37, Issue 12, 2002, Pages 1961-1971
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Study of scattering of charge carriers in thin films of (Bi0.25Sb0.75)2Te3 alloy with 2% excess Te
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Author keywords
A. Chalcog nides; A. Electronic materials; A. Semiconductors; A. Thin films; A. Vapour deposition; D. Defects; D. Electrical properties
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Indexed keywords
BISMUTH ALLOYS;
CHARGE CARRIERS;
ELECTRIC CONDUCTIVITY;
RELAXATION PROCESSES;
SEMICONDUCTOR MATERIALS;
TRANSPORT PROPERTIES;
VAPOR DEPOSITION;
ELECTRONIC MATERIALS;
THIN FILMS;
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EID: 0037015649
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/S0025-5408(02)00810-3 Document Type: Article |
Times cited : (23)
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References (13)
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