Dielectric properties of B2O3-doped (1 - x)LaAlO3-xSrTiO3 ceramic system at microwave frequency

Materials Research Bulletin

Volumn 37, Issue 12, 2002, Pages 1941-1948

  Huang, Cheng Liang ^a   Chiang, Kuo Hau ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

A. Ceramics; A. Oxides; C. X ray diffraction; D. Dielectric properties

Indexed keywords

BORON COMPOUNDS; DENSIFICATION; DOPING (ADDITIVES); LANTHANUM COMPOUNDS; MICROSTRUCTURE; MICROWAVES; NATURAL FREQUENCIES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

MICROWAVE FREQUENCIES;

CERAMIC MATERIALS;

EID: 0037015635     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(02)00871-1     Document Type: Article

References (14)

1. Nomura S., Toyama K., Kaneta K. Jpn. J. Appl. Phys. 21 1982 L624.
2. Wolfram G., Gobel H.E. Mater. Res. Bull. 16 1981 1455.
3. I. Burn, US Patent No. 4,845,062 (1989).
4. Cho S.-Y., Kim I.-T., Hong K.-S. J. Mater. Res. 14 1999 114.
5. Sun P.-H., Nakamura T., Shan Y.J., Inaguma Y., Itoh M. Jpn. J. Appl. Phys. 37 1998 5625.
6. Cho S.-Y., Hong K.-S., Ko K.-H. Mater. Res. Bull. 34 1999 511.
7. Kakada T., Wang S.F., Syoshikawa, Jang S.T., Newnham R.E. J. Am. Ceram. Soc. 77 1994 1909.
8. Kakada T., Wang S.F., Syoshikawa, Jang S.T., Newnham R.E. J. Am. Ceram. Soc. 77 1994 2485.
9. Hirno S.I., Takashi, Hayashi, Hattori A. J. Am. Ceram. Soc. 74 1991 1320.
10. Tolmer V., Desqardin G. J. Am. Ceram. Soc. 80 1997 1981.
11. Huang C.-L., Hsu C.S. Mater. Res. Bull. 36 2001 2677.
12. Hakki B.W., Coleman P.D. IEEE Trans. Microwave Theory & Tech. 8 1960 402.
13. Courtney W.E. IEEE Trans. Microwave Theory & Tech. 18 1970 476.
14. Silverman B.D. Phys. Rev. 125 1962 1921.