A new quantitative determination of stress by Raman spectroscopy in diamond grown on alumina

Journal of Physics Condensed Matter

Volumn 14, Issue 21, 2002, Pages 5271-5276

  Fang, Zhijun ^a   Xia, Yiben ^a   Wang, Linjun ^a   Wang, Zhiming ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CHEMICAL VAPOR DEPOSITION; COMPRESSIVE STRESS; CRYSTAL GROWTH; GRAIN GROWTH; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; THIN FILMS;

BIAXIAL STRESSES;

SEMICONDUCTING DIAMONDS;

EID: 0037013655     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/14/21/302     Document Type: Article

References (7)